Patents 목록 논문 정보 Title Lorentz Force Microscope and Method of Measuring Magnetic Domain Using Lorentz Force Inventor S. Hong, H. Shin, J. U. Jeon Code 1 KR 0474844 (2005)(issued) Code 2 KR 0474844 (2005)(issued)
목록 논문 정보 Title Lorentz Force Microscope and Method of Measuring Magnetic Domain Using Lorentz Force Inventor S. Hong, H. Shin, J. U. Jeon Code 1 KR 0474844 (2005)(issued) Code 2 KR 0474844 (2005)(issued)